Investigations of structural and optical properties of zinc oxide thin films growth on various substrates

In this research, the structural and optical properties of Zinc Oxide (ZnO) thin film were successfully depositedon various substrates including silicon (Si), sapphire (Al2O3), polyethylene terephthalate (PET) and poly-propylene carbonate (PPC) by Radio Frequency (RF) sputtering technique. In this project, the structural andoptical properties of the samples were studied by using X-ray diffraction (XRD), field-emission scanning electronmicroscopy (FESEM), atomic force microscopy (AFM), Raman Spectroscopy, and Photoluminescence (PL). TheXRD test revealed that the samples have a wurtzite structure as the peaks dominated by ZnO (0 0 2). AFM testfound out that root mean square (rms) for thin film samples ranging from 1 to 8 nm. Raman spectra detected theexistence of certain Raman-active modes inside the samples. In PL spectra, the peak emissions observed for allthe ZnO thin film samples ranging around 376.05–381.5 nm, thus closer to the pure ZnO. Through the FESEMimage, most of the samples except ZnO/PPC sample showed the granular surface morphology, while the ZnO/PPC sample revealed the hexagonal like shapes with uniform distribution. The results exhibited that the ZnO thinfilms grown on ZnO/PET have the best quality among all the samples.

Author: Siti Huzaimah